IEC
IEC
-
Technical committeeTypeAcronymIEC 61000-4-27CommitteePublished year2000KeywordsDescription
Considers immunity tests for electric and/or electronic equipment (apparatus and system) in its electromagnetic environment. Only conducted phenomena are considered, including immunity tests for equipment connected to public and industrial networks. Establishes a reference for evaluating the immunity of electrical and electronic equipment when subjected to unbalanced power supply voltage. Applies to 50 Hz/60 Hz three-phase powered electrical and/or electronic equipment with rated line current up to 16 A per phase.
-
Technical committeeTypeAcronymIEC 61000-4-25CommitteePublished year2001Description
-
Technical committeeTypeAcronymIEC 61000-4-24CommitteePublished year1997Description
-
Technical committeeTypeAcronymIEC 61000-4-23CommitteePublished year2000Description
-
Technical committeeTypeAcronymIEC 61000-4-22CommitteePublished year2010KeywordsDescription
IEC 61000-4-22:2010 considers immunity tests and emission measurements for electric and/or electronic equipment. Only radiated phenomena are considered. It establishes the required test procedures for using fully anechoic rooms for performing radiated immunity testing and radiated emission measurements. IEC 61000-4-22:2010 establishes a common validation procedure, equipment under test (EUT) set-up requirements, and measurement methods for fully anechoic rooms (FARs) when both radiated electromagnetic emission measurements and radiated electromagnetic immunity tests will be performed in the same FAR. As a basic measurement standard, this part of IEC 61000 does not intend to specify the test levels or emission limits to be applied to particular apparatus or system(s). Its main goal is to provide general measurement procedures to all concerned product committees of IEC or CISPR. Specific product requirements and test conditions are defined by the responsible product committees. The methods described in this standard are appropriate for radiated emission measurements and immunity tests in the frequency range of 30 MHz to 18 GHz. IEC 61000-4-22:2010 has the status of a basic EMC publication in accordance with IEC Guide 107, Electromagnetic compatibility - Guide to the drafting of electromagnetic compatibility publications.
-
Technical committeeTypeAcronymIEC 61000-4-21CommitteePublished year2011KeywordsDescription
IEC 61000-4-21:2011 considers tests of immunity and intentional or unintentional emissions for electric and/or electronic equipment and tests of screening effectiveness in reverberation chambers. It establishes the required test procedures for performing such tests. Only radiated phenomena are considered. The objective of IEC 61000-4-21:2011 is to establish a common reference for using reverberation chambers to evaluate the performance of electric and electronic equipment when subjected to radio-frequency electromagnetic fields and for determining the levels of radio-frequency radiation emitted from electric and electronic equipment. IEC 61000-4-21:2011 does not intend to specify the tests to be applied to a particular apparatus or system. Its main aim is to give a general basic reference to all concerned product committees of the IEC. The product committees should select emission limits and test methods in consultation with CISPR. The product committees remain responsible for the appropriate choice of the immunity tests and the immunity test limits to be applied to their equipment. Other methods, such as those covered in IEC 61000-4-3, CISPR 16-2-3 and CISPR 16-2-4 may be used. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision and includes the following significant technical changes with respectto the first edition:
- In Clause 8, the use and specifications of E-field probes for application to reverberation chambers has been added.
- In Annex A, additional guidance and clarifications on the use of reverberation chambers at relatively low frequencies of operation (i.e., close to the lowest usable frequency of a given chamber) are given, and its implications on the estimation of field uncertainty are outlined.
- In Annex B, symmetric location of the field probes when the chamber exhibits cylindrical symmetry has been disallowed, as such placement could otherwise yield a false indication of field uniformity and chamber performance at different locations.
- Annex C now contains more quantitative guidance on the setting of the maximum permissible stirring speeds that warrant quasi-static conditions of operation for chamber validation and testing.
- In Annex D, a requirement for the EUT and equipment not to occupy more than 8 % of the total chamber volume in immunity testing has been added.
- Annex E has been extended with further guidance on the value of EUT directivity to be used in the estimation of radiated power and field.
- In Annex I, some clarifications on antenna efficiency measurements have been added.
- A new Annex K has been added that covers measurement uncertainty in reverberation chambers. -
Technical committeeTypeAcronymIEC 61000-4-20CommitteePublished year2010KeywordsDescription
IEC 61000-4-20:2010 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example, striplines and electromagnetic pulse simulators) and closed structures (for example, TEM cells). These structures can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe:
- TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations;
- TEM waveguide validation methods for EMC tests;
- the EUT (i.e. EUT cabinet and cabling) definition;
- test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and
- test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.
IEC 61000-4-20:2010 does not intend to specify the tests to be applied to any particular apparatus or system(s). The main intention of this standard is to provide a general basic reference for all interested product committees of the IEC. For radiated emissions testing, product committees should select emission limits and test methods in consultation with CISPR standards. For radiated immunity testing, product committees remain responsible for the appropriate choice of immunity tests and immunity test limits to be applied to equipment within their scope. This standard describes test methods that are separate from those of IEC 61000-4-3. This second edition cancels and replaces the first edition published in 2003 and its amendment 1 (2006), and constitutes a technical revision. It has the status of a basic EMC publication in accordance with IEC Guide 107. The main changes with respect to the first edition of this standard and its amendment are the following:
- consistency of terms (e.g. test, measurement, etc.) has been improved;
- clauses covering test considerations, evaluations and the test report have been added;
- references to large TEM waveguides have been eliminated;
- a new informative annex has been added to deal with calibration of E-field probes. -
Technical committeeTypeAcronymIEC 61000-4-2CommitteePublished year2008Description
IEC 61000-4-2:2008 relates to the immunity requirements and test methods for electrical and electronic equipment subjected to static electricity discharges, from operators directly, and from personnel to adjacent objects. It additionally defines ranges of test levels which relate to different environmental and installation conditions and establishes test procedures. The object of IEC 61000-4-2:2008 is to establish a common and reproducible basis for evaluating the performance of electrical and electronic equipment when subjected to electrostatic discharges. In addition, it includes electrostatic discharges which may occur frompersonnel to objects near vital equipment. IEC 61000-4-2:2008 defines typical waveform of the discharge current, range of test levels, test equipment, test setup, test procedure, calibration procedure and measurement uncertainty. IEC 61000-4-2:2008 gives specifications for test performed in "laboratories" and "post-installation tests" performed on equipment in the final installation. This second edition cancels and replaces the first edition published in 1995, its amendment 1 (1998) and its amendment 2 (2000) and constitutes a technical revision. It has the status of a basic EMC publication in accordance with IEC Guide 107. The main changes with respect to the first edition of this standard and its amendments are the following:
- the specifications of the target have been extended up to 4 GHz. An example of target matching these requirements is also provided;
- information on radiated fields from human-metal discharge and from ESD generators is provided;
- measurement uncertainty considerations with examples of uncertainty budgets are given too. -
Technical committeeTypeAcronymIEC 61000-4-19CommitteePublished year2014KeywordsDescription
IEC 61000-4-19:2014 relates to the immunity requirements and test methods for electrical and electronic equipment to conducted, differential mode disturbances and signalling in the range 2 kHz up to 150 kHz at a.c. power ports. The object of this standard is to establish a common and reproducible basis for testing electrical and electronic equipment with the application of differential mode disturbances and signalling to a.c. power ports. This standard defines:
- test waveforms;
- range of test levels;
- test equipment;
- test setup;
- test procedures;
- and verification procedures. These tests are intended to demonstrate the immunity of electrical and electronic equipment operating at a mains supply voltage up to 280 V (from phase to neutral or phase to earth, if no neutral is used) and a frequency of 50 Hz or 60 Hz when subjected to conducted, differential mode disturbances such as those originating from power electronics and power line communication systems. The immunity to harmonics and interharmonics, including mains signalling, on a.c. power ports up to 2 kHz in differential mode is covered by IEC 61000-4-13. Emissions in the frequency range 2 kHz to 150 kHz often have both differential mode and common mode components. This standard provides immunity tests only for differential mode disturbances and signalling. It is recommended to perform common mode tests as well, which are covered by IEC 61000-4-16. Key words: electromagnetic compatibility, EMC -
Technical committeeTypeAcronymIEC 61000-4-18CommitteePublished year2006Description
IEC 61000-4-18: 2019 focuses on the immunity requirements and test methods for electrical and electronic equipment, under operational conditions, with regard to:
a) repetitive slow damped oscillatory waves occurring mainly in power, control and signal cables installed in high voltage and medium voltage (HV/MV) substations;
b) repetitive fast damped oscillatory waves occurring mainly in power, control and signal cables installed in gas insulated substations (GIS) and in some cases also air insulated substations (AIS) or in any installation due to high-altitude electromagnetic pulse (HEMP) phenomena.
The object of this document is to establish a common and reproducible reference for evaluating the immunity of electrical and electronic equipment when subjected to damped oscillatory waves on supply, signal, control and earth ports. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. NOTE As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard is applied or not, and if applied, they are responsible for determining the appropriate test levels and performance criteria. The document defines:
test voltage and current waveforms;
ranges of test levels;
test equipment;
calibration and verification procedures of test equipment;
test setups;
test procedure.
This second edition cancels and replaces the first edition published in 2006 and its Amendment 1:2010. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) addition of a mathematical modelling of damped oscillatory wave waveform;
b) new Annex B on measurement uncertainty;
c) addition high speed CDN;
d) addition of calibration procedures for CDNs;
e) addition of the use of the capacitive coupling clamp on interconnection lines for fast damped oscillatory waves;
f) addition of a test procedure for DC/DC converters in case the CDN does not work;
g) new Annex C on issues relating to powering EUTs having DC/DC converters at the input.
Keywords: immunity requirements and test methods for electrical and electronic equipment
The contents of the corrigendum of August 2019 have been included in this copy.