IEC
IEC
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Technical committeeTypeAcronymIEC 61000-4-5CommitteePublished year2014Description
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Technical committeeTypeAcronymIEC 61000-4-4CommitteePublished year2012Description
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Technical committeeTypeAcronymIEC 61000-4-36CommitteeKeywordsDescription
IEC 61000-4-36:2020 is available as IEC 61000-4-36:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61000-4-36:2020 provides methods to determine test levels for the assessment of the immunity of equipment and systems to intentional electromagnetic interference (IEMI) sources. It introduces the general IEMI problem, IEMI source parameters, derivation of test limits and summarises practical test methods. This second edition cancels and replaces the first edition published in 2014. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
- addition of a hyperband and mesoband radiated transients immunity test method in
- Annex H;
- addition of a calibration method of sensors for radiated hyperband and mesoband transient fields and measurement uncertainty in Annex I. -
Technical committeeTypeAcronymIEC 61000-4-34CommitteePublished year2005KeywordsDescription
This part of IEC 61000 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This standard applies to electrical and electronic equipment having a rated input current exceeding 16 A per phase. It covers equipment installed in residential areas as well as industrial machinery, specifically voltage dips and short interruptions for equipment connected to either 50 Hz or 60 Hz a.c. networks, including 1-phase and 3-phase mains. The object of this standard is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of equipment or a system against a defined phenomenon. It has the status of a Basic EMC Publication in accordance with IEC Guide 107.
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Technical committeeTypeAcronymIEC 61000-4-33CommitteePublished year2005Description
Provides a basic description of the methods and means (e.g., instrumentation) for measuring responses arising from high-power transient electromagnetic parameters. These responses can include: - the electric (E) and/or magnetic (H) fields (e.g., incident fields or incident plus scattered fields within a system under test); - the current I (e.g., induced by a transient field or within a system under test); - the voltage V (e.g., induced by a transient field or within a system under test); - the charge Q induced on a cable or other conductor. These measured quantities are generally complicated time-dependent waveforms, which can be described approximately by several scalar parameters, or "observables". These parameters include: - the peak amplitude of the response, - the waveform rise-time, - the pulse width, and - mathematically defined norms obtained from the waveform. This International Standard provides information on the measurement of these waveforms and on the mathematical determination of the characterizing parameters. It does not provide information on specific level requirements for testing. It has the status of a basic EMC publication in accordance with IEC Guide 107.
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Technical committeeTypeAcronymIEC 61000-4-31CommitteePublished year2016Description
IEC 61000-4-31:2016 relates to the conducted immunity of electrical and electronic equipment to electromagnetic disturbances coming from intended and/or unintended broadband signal sources in the frequency range 150 kHz up to 80 MHz. It has the status of a basic EMC publication in accordance with IEC Guide 107.
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Technical committeeTypeAcronymIEC 61000-4-30CommitteePublished year2008Description
IEC 61000-4-30:2015+A1:2021 defines the methods for measurement and interpretation of results for power quality parameters in a.c. power supply systems with a declared fundamental frequency of 50 Hz or 60 Hz. Measurement methods are described for each relevant parameter in terms that give reliable and repeatable results, regardless of the method's implementation. This standard addresses measurement methods for in-situ measurements. Measurement of parameters covered by this standard is limited to conducted phenomena in power systems. The power quality parameters considered in this standard are power frequency, magnitude of the supply voltage, flicker, supply voltage dips and swells, voltage interruptions, transient voltages, supply voltage unbalance, voltage harmonics and interharmonics, mains signalling on the supply voltage, rapid voltage changes, and current measurements. Emissions in the 2 kHz to 150 kHz range are considered in Annex C (informative), and over- and underdeviations are considered in Annex D (informative). Depending on the purpose of the measurement, all or a subset of the phenomena on this list may be measured. This third edition cancels and replaces the second edition published in 2008. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
- the measurement method for current, previously informative, is now normative with some changes;
- the measurement method for RVC (rapid voltage change) has been added;
- the measurement method for conducted emissions in the 2 kHz to 150 kHz range has been added in informative Annex C;
- underdeviation and overdeviation parameters are moved to informative Annex D;
- Class A and Class S measurement methods are defined and clarified, while Class B is moved to informative Annex E and considered for future removal;
- measurement methods continue in this standard, but responsibility for influence quantities, performance, and test procedures are transferred to IEC 62586-2.
The contents of the corrigendum of December 2016 have been included in this copy.
This consolidated version consists of the third edition (2015) and its amendment 1 (2021). Therefore, no need to order amendment in addition to this publication. -
Technical committeeTypeAcronymIEC 61000-4-3CommitteePublished year2006Description
IEC 61000-4-3:2020 is applicable to the immunity requirements of electrical and electronic equipment to radiated electromagnetic energy. It establishes test levels and the required test procedures. The object of this document is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to radiated, radio-frequency electromagnetic fields. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of an equipment or system against RF electromagnetic fields from RF sources not in close proximity to the EUT. The test environment is specified in Clause 6. NOTE 1 As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard should be applied or not, and if applied, they are responsible for determining the appropriate test levels and performance criteria. TC 77 and its sub-committees are prepared to co-operate with product committees in the evaluation of the value of particular immunity tests for their products. NOTE 2 Immunity testing against RF sources in close proximity to the EUT is defined in IEC 61000-4-39. Particular considerations are devoted to the protection against radio-frequency emissions from digital radiotelephones and other RF emitting devices. NOTE 3 Test methods are defined in this part for evaluating the effect that electromagnetic radiation has on the equipment concerned. The simulation and measurement of electromagnetic radiation is not adequately exact for quantitative determination of effects. The test methods defined in this basic document have the primary objective of establishing an adequate reproducibility of testing configuration and repeatability of test results at various test facilities. This document is an independent test method. It is not possible to use other test methods as substitutes for claiming compliance with this document. This fourth edition cancels and replaces the third edition published in 2006, Amendment 1:2007 and Amendment 2:2010. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
- testing using multiple test signals has been described;
- additional information on EUT and cable layout has been added;
- the upper frequency limitation has been removed to take account of new services;
- the characterization of the field as well as the checking of power amplifier linearity of the immunity chain are specified. -
Technical committeeTypeAcronymIEC 61000-4-29CommitteePublished year2000Description
Establishes a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. power ports. This standard defines: - the range of test levels; - the test generator; - the test set-up; - the test procedure.
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Technical committeeTypeAcronymIEC 61000-4-28CommitteePublished year1999KeywordsDescription
IEC 61000-4-28:1999+A1:2001+A2:2009 establishes a reference for evaluating the immunity of electric and electronic equipment when subjected to variations of the power frequency. Only conducted phenomena are considered, including immunity tests for equipment connected to public and industrial networks. This consolidated version consists of the first edition (1999), its amendment 1 (2001) and its amendment 2 (2009). Therefore, no need to order amendments in addition to this publication.