Test and Diagnosis for Electronic Systems
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Technical committeeTypeAcronymIEEE 62529-2012 - IEC 62529:2012€CommitteePublished year2012KeywordsDescription
Adoption of IEEE Std 1641-2010. This standard provides the means to define and describe signals used in testing. It also provides a set of common basic signals, built upon formal mathematical specifications so that signals can be combined to form complex signals usable across all test platforms.
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Technical committeeTypeAcronymIEEE 62243-2010CommitteePublished year2010KeywordsDescription
Data interchange and standard software services for test and diagnostic environments are defined by Artificial Intelligence Exchange and Service Tie to All Test Environments (AIESTATE). The purpose of AI-ESTATE is to standardize interfaces for functional elements of an intelligent diagnostic reasoner and representations of diagnostic knowledge and data for use by such diagnostic reasoners. Formal information models are defined to form the basis for a format to facilitate exchange of persistent diagnostic information between two reasoners and also to provide a formal typing system for diagnostic services. The services to control a diagnostic reasoned are defined by this standard.
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Technical committeeTypeAcronymIEEE 1636.99-2013CommitteePublished year2013KeywordsDescription
This standard is intended to promote and facilitate interoperability between components of SIMICA. The standard defines EXPRESS information models and XML schemas that together define the common information elements supporting these interfaces.
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Technical committeeTypeAcronymIEEE 1636.2-2018CommitteePublished year2018KeywordsDescription
Promoting and facilitating interoperability components of automatic test systems where actions taken during maintenance need to be shared is addressed in this standard. The standard thus facilitates the capture of maintenance action information data in storage devices and databases, facilitating online and offline analysis. The maintenance action information schema becomes a class of information that can be used within the SIMICA family of standards. The exchange format is expressed in both the OWL and XML formats.
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Technical committeeTypeAcronymIEEE 1636-2018CommitteePublished year2018KeywordsDescription
Promoting and facilitating interoperability between components of automatic test systems where test results and/or maintenance actions need to be shared is addressed in this standard. The standard defines the common elements between both test results data and maintenance action data. The common schema becomes a class of information that shall be used within the SIMICA family of standards.
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Technical committeeTypeAcronymIEEE 1546-2000CommitteePublished year2000KeywordsDescription
An aid in the understanding and use of digital test interchange format (DTIF) files is provided in this guide. This information will be an aid to users in developing tools such as pre-processors and postprocessors of DTIF data and other utilities.
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Technical committeeTypeAcronymIEEE 1445-2016CommitteePublished year2016KeywordsDescription
The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.
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Technical committeeTypeAcronymIEEE 1232.3-2014CommitteePublished year2014KeywordsDescription
Guidance to developers of IEEE Std 1232-conformant applications is provided in this guide. A simple doorbell is used as an example system under test to illustrate how the static model constructs of Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) are used to form a diagnostic reasoner knowledge base. Each of AI-ESTATE’s knowledge base types is discussed in conceptual terms, and how those concepts are represented in exchange files is shown. Also, some of the nuanced aspects of diagnostic knowledge bases in AI-ESTATE are clarified. An example reasoner session is provided to illustrate the use of AI-ESTATE services.
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Technical committeeTypeAcronymIEEE 1232-2010CommitteePublished year2010KeywordsDescription
Data interchange and standard software services for test and diagnostic environments are defined by Artificial Intelligence Exchange and Service Tie to All Test Environments (AIESTATE). The purpose of AI-ESTATE is to standardize interfaces for functional elements of an intelligent diagnostic reasoner and representations of diagnostic knowledge and data for use by such diagnostic reasoners. Formal information models are defined to form the basis for a format to facilitate exchange of persistent diagnostic information between two reasoners and also to provide a formal typing system for diagnostic services. The services to control a diagnostic reasoned are defined by this standard.