Substation
Substation
-
Technical committeeTypeAcronymIEC 61850-7-4:2010+AMD1:2020 CSV Consolidated versionCommitteePublished year2020KeywordsDescription
IEC 61850-7-4:2010+A1:2020 specifies the information model of devices and functions generally related to common use regarding applications in systems for power utility automation. It also contains the information model of devices and function-related applications in substations. In particular, it specifies the compatible logical node names and data object names for communication between intelligent electronic devices (IED). This includes the relationship between logical nodes and data objects. Major technical changes with regard to the previous edition are as follows: corrections and clarifications according to technical issues raised by the users' community; extensions for new logical nodes for the power quality domain; extensions for the model for statistical and historical statistical data; extensions regarding IEC 61850-90-1; extensions for new logical nodes for monitoring functions according to IEC 62271; new logical nodes from IEC 61850-7-410 and IEC 61850-7-420 of general interest.
-
Technical committeeTypeAcronymIEC 61850-7-1:2011+AMD1:2020 CSV Consolidated versionCommitteePublished year2020KeywordsDescription
IEC 61850-7-1:2011+A1:2020 introduces the modelling methods, communication principles, and information models that are used in the various parts of the IEC 61850-7 series. The purpose is to provide - from a conceptual point of view - assistance to understand the basic modelling concepts and description methods for: substation-specific information models for power utility automation systems, device functions used for power utility automation purposes, and communication systems to provide interoperability within power utility facilities. Compared to the first edition, this second edition introduces: the model for statistical and historical statistical data, the concepts of proxies, gateways, LD hierarchy and LN inputs, the model for time synchronisation, the concepts behind different testing facilities, the extended logging function. It also clarifies certain items.