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IEC 61215-1-3:2021 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 61215-1-3:2021 lays down requirements for the design qualification of terrestrial photovoltaic modules suitable for long-term operation in open-air climates. The useful service life of modules so qualified will depend on their design, their environment and the conditions under which they are operated. Test results are not construed as a quantitative prediction of module lifetime. This document is intended to apply to all thin-film amorphous silicon (a-Si; a-Si/µc-Si) based terrestrial flat plate modules. As such, it addresses special requirements for testing of this technology supplementing IEC 61215-1:2021 and IEC 61215-2:2021 requirements for testing. This second edition cancels and replaces the first edition of IEC 61215-1-3, issued in 2016. This edition includes the following significant technical changes with respect to the previous edition: a. A cyclic (dynamic) mechanical load test (MQT 20) added. b. A test for detection of potential-induced degradation (MQT 21) added. c. A bending test (MQT 22) for flexible modules.

IEC 61215-1-2:2021 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 61215-1-2:2021 lays down requirements for the design qualification of terrestrial photovoltaic modules suitable for long-term operation in open-air climates. The useful service life of modules so qualified will depend on their design, their environment and the conditions under which they are operated. Test results are not construed as a quantitative prediction of module lifetime. This document is intended to apply to all thin-film CdTe based terrestrial flat plate modules. As such, it addresses special requirements for testing of this technology supplementing IEC 61215-1:2021 and IEC 61215-2:2021 requirements for testing. This document defines PV technology dependent modifications to the testing procedures and requirements per IEC 61215-1:2021 and IEC 61215-2:2021. This second edition cancels and replaces the first edition of IEC 61215-1-2, issued in 2016. This edition includes the following significant technical changes with respect to the previous edition: a. A cyclic (dynamic) mechanical load test (MQT 20) added. b. A test for detection of potential-induced degradation (MQT 21) added. c. A bending test (MQT 22) for flexible modules added.

IEC 61215-1-1:2021 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 61215-1-1:2021 lays down requirements for the design qualification of terrestrial photovoltaic modules suitable for long-term operation in open-air climates. The useful service life of modules so qualified will depend on their design, their environment and the conditions under which they are operated. Test results are not construed as a quantitative prediction of module lifetime. In climates where 98th percentile operating temperatures exceed 70 °C, users are recommended to consider testing to higher temperature test conditions as described in IEC TS 63126. This document is intended to apply to all crystalline silicon terrestrial flat plate modules. This second edition cancels and replaces the first edition of IEC 61215-1-1, issued in 2016. This edition includes the following significant technical changes with respect to the previous edition: a. A cyclic (dynamic) mechanical load test (MQT 20) added. b. A test for detection of potential-induced degradation (MQT 21) added. c. A bending test (MQT 22) for flexible modules added. d. A procedure for stress specific stabilization – BO LID (MQT 19.3) added. e. A final stabilization procedure for modules undergoing PID testing added

IEC 60904-8:2014 specifies the requirements for the measurement of the spectral responsivity of both linear and non-linear photovoltaic devices. The spectral responsivity of a photovoltaic device is used in cell development and cell analysis, as it provides a measure of recombination and other processes occurring inside the semiconductor or cell material system. The main technical changes with respect to the previous edition are listed below: - re-writing of the clause on testing; - addition of a new clause for the measurement of series-connected modules; - addition of the requirements of ISO/IEC 17025.

IEC 60904-8-1:2017 gives guidance for the measurement of the spectral responsivity of multi-junction photovoltaic devices. It is principally intended for non-concentrating devices, but parts may be applicable also to concentrating multi-junction PV devices. The SR is required for analysis of measured current-voltage characteristics of multi-junction PV devices as described in IEC 60904-1-1.

IEC 60904-8:2014 specifies the requirements for the measurement of the spectral responsivity of both linear and non-linear photovoltaic devices. The spectral responsivity of a photovoltaic device is used in cell development and cell analysis, as it provides a measure of recombination and other processes occurring inside the semiconductor or cell material system. The main technical changes with respect to the previous edition are listed below:
- re-writing of the clause on testing;
- addition of a new clause for the measurement of series-connected modules;
- addition of the requirements of ISO/IEC 17025.

IEC 60904-7:2019 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 60904-7:2019 describes the procedure for correcting the spectral mismatch error introduced in the testing of a photovoltaic device, caused by the mismatch between the test spectrum and the reference spectrum (e.g. AM1.5 spectrum) and by the mismatch between the spectral responsivities (SR) of the reference device and of the device under test and therewith reduce the systematic uncertainty. This procedure is valid for single-junction devices but the principle may be extended to cover multi-junction devices. The purpose of this document is to give guidelines for the correction of the spectral mismatch error, should there be a spectral mismatch between the test spectrum and the reference spectrum as well as between the reference device SR and the device under test SR. The calculated spectral mismatch correction is only valid for the specific combination of test and reference devices measured with a particular test spectrum. This fourth edition cancels and replaces the third edition published in 2008. The main technical changes with respect to the previous edition are as follows: - For better compatibility and less redundancy, the clause “Determination of test spectrum” refers to IEC 60904-9. - The spectral mismatch factor is called SMM instead of MM to enable differentiation to the angular mismatch factor AMM and spectral angular mismatch factor SAMM. - Formulae for the derivation and application of the spectral mismatch factor SMM are added. - Links to new standards are given, e.g. concerning multi-junction devices. - Corrected wording (responsivity instead of response and irradiance instead of intensity).

IEC 60904-7:2019 is available as IEC 60904-7:2019 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 60904-7:2019 describes the procedure for correcting the spectral mismatch error introduced in the testing of a photovoltaic device, caused by the mismatch between the test spectrum and the reference spectrum (e.g. AM1.5 spectrum) and by the mismatch between the spectral responsivities (SR) of the reference device and of the device under test and therewith reduce the systematic uncertainty. This procedure is valid for single-junction devices but the principle may be extended to cover multi-junction devices. The purpose of this document is to give guidelines for the correction of the spectral mismatch error, should there be a spectral mismatch between the test spectrum and the reference spectrum as well as between the reference device SR and the device under test SR. The calculated spectral mismatch correction is only valid for the specific combination of test and reference devices measured with a particular test spectrum. This fourth edition cancels and replaces the third edition published in 2008. The main technical changes with respect to the previous edition are as follows:
- For better compatibility and less redundancy, the clause “Determination of test spectrum” refers to IEC 60904-9.
- The spectral mismatch factor is called SMM instead of MM to enable differentiation to the angular mismatch factor AMM and spectral angular mismatch factor SAMM.
- Formulae for the derivation and application of the spectral mismatch factor SMM are added.
- Links to new standards are given, e.g. concerning multi-junction devices.
- Corrected wording (responsivity instead of response and irradiance instead of intensity).

IEC 60904-5:2011 describes the preferred method for determining the equivalent cell temperature (ECT) of PV devices (cells, modules and arrays of one type of module), for the purposes of comparing their thermal characteristics, determining NOCT (nominal operating cell temperature) and translating measured I-V characteristics to other temperatures. The main technical changes with regard to the previous edition are as follows:
- added method on how to extract the input parameters;
- rewritten method on how to calculate ECT;
- reworked formulae to be in line with IEC 60891.

IEC 60904-5:2011 describes the preferred method for determining the equivalent cell temperature (ECT) of PV devices (cells, modules and arrays of one type of module), for the purposes of comparing their thermal characteristics, determining NOCT (nominal operating cell temperature) and translating measured I-V characteristics to other temperatures. The main technical changes with regard to the previous edition are as follows:
- added method on how to extract the input parameters;
- rewritten method on how to calculate ECT;
- reworked formulae to be in line with IEC 60891.