High Frequency Phenomena
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Technical committeeTypeAcronymIEC 61643-311CommitteePublished year2013KeywordsDescription
IEC 61643-311:2013 is applicable to gas discharge tubes (GDT) used for overvoltage protection in telecommunications, signalling and low-voltage power distribution networks with nominal system voltages up to 1 000 V (r.m.s.) a.c. and 1 500 V d.c..They are defined as a gap, or several gaps with two or three metal electrodes hermetically sealed so that gas mixture and pressure are under control. They are designed to protect apparatus or personnel, or both, from high transient voltages. This standard contains a series of test criteria, test methods and test circuits for determining the electrical characteristics of GDTs having two or three electrodes. This standard does not specify requirements applicable to complete surge protective devices, nor does it specify total requirements for GDTs employed within electronic devices, where precise coordination between GDT performance and surge protective device withstand capability is highly critical. This second edition of IEC 61643-311 cancels and replaces the first edition published in 2001. It constitutes a technical revision. Specific changes with respect to the previous edition are: Addition of performance values. Key words: gas discharge tubes (GDT), overvoltage protection in telecommunications, signalling and low-voltage power distribution networks, nominal system voltages up to 1 000 V (r.m.s.) a.c. and 1 500 V d.c.
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Technical committeeTypeAcronymIEC 61000-4-9CommitteePublished year1993Description
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Technical committeeTypeAcronymIEC 61000-4-6CommitteePublished year2013Description
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Technical committeeTypeAcronymIEC 61000-4-5CommitteePublished year2014Description
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Technical committeeTypeAcronymIEC 61000-4-4CommitteePublished year2012Description
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Technical committeeTypeAcronymIEC 61000-4-31CommitteePublished year2016Description
IEC 61000-4-31:2016 relates to the conducted immunity of electrical and electronic equipment to electromagnetic disturbances coming from intended and/or unintended broadband signal sources in the frequency range 150 kHz up to 80 MHz. It has the status of a basic EMC publication in accordance with IEC Guide 107.
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Technical committeeTypeAcronymIEC 61000-4-3CommitteePublished year2006Description
IEC 61000-4-3:2020 is applicable to the immunity requirements of electrical and electronic equipment to radiated electromagnetic energy. It establishes test levels and the required test procedures. The object of this document is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to radiated, radio-frequency electromagnetic fields. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of an equipment or system against RF electromagnetic fields from RF sources not in close proximity to the EUT. The test environment is specified in Clause 6. NOTE 1 As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard should be applied or not, and if applied, they are responsible for determining the appropriate test levels and performance criteria. TC 77 and its sub-committees are prepared to co-operate with product committees in the evaluation of the value of particular immunity tests for their products. NOTE 2 Immunity testing against RF sources in close proximity to the EUT is defined in IEC 61000-4-39. Particular considerations are devoted to the protection against radio-frequency emissions from digital radiotelephones and other RF emitting devices. NOTE 3 Test methods are defined in this part for evaluating the effect that electromagnetic radiation has on the equipment concerned. The simulation and measurement of electromagnetic radiation is not adequately exact for quantitative determination of effects. The test methods defined in this basic document have the primary objective of establishing an adequate reproducibility of testing configuration and repeatability of test results at various test facilities. This document is an independent test method. It is not possible to use other test methods as substitutes for claiming compliance with this document. This fourth edition cancels and replaces the third edition published in 2006, Amendment 1:2007 and Amendment 2:2010. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
- testing using multiple test signals has been described;
- additional information on EUT and cable layout has been added;
- the upper frequency limitation has been removed to take account of new services;
- the characterization of the field as well as the checking of power amplifier linearity of the immunity chain are specified. -
Technical committeeTypeAcronymIEC 61000-4-21CommitteePublished year2011KeywordsDescription
IEC 61000-4-21:2011 considers tests of immunity and intentional or unintentional emissions for electric and/or electronic equipment and tests of screening effectiveness in reverberation chambers. It establishes the required test procedures for performing such tests. Only radiated phenomena are considered. The objective of IEC 61000-4-21:2011 is to establish a common reference for using reverberation chambers to evaluate the performance of electric and electronic equipment when subjected to radio-frequency electromagnetic fields and for determining the levels of radio-frequency radiation emitted from electric and electronic equipment. IEC 61000-4-21:2011 does not intend to specify the tests to be applied to a particular apparatus or system. Its main aim is to give a general basic reference to all concerned product committees of the IEC. The product committees should select emission limits and test methods in consultation with CISPR. The product committees remain responsible for the appropriate choice of the immunity tests and the immunity test limits to be applied to their equipment. Other methods, such as those covered in IEC 61000-4-3, CISPR 16-2-3 and CISPR 16-2-4 may be used. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision and includes the following significant technical changes with respectto the first edition:
- In Clause 8, the use and specifications of E-field probes for application to reverberation chambers has been added.
- In Annex A, additional guidance and clarifications on the use of reverberation chambers at relatively low frequencies of operation (i.e., close to the lowest usable frequency of a given chamber) are given, and its implications on the estimation of field uncertainty are outlined.
- In Annex B, symmetric location of the field probes when the chamber exhibits cylindrical symmetry has been disallowed, as such placement could otherwise yield a false indication of field uniformity and chamber performance at different locations.
- Annex C now contains more quantitative guidance on the setting of the maximum permissible stirring speeds that warrant quasi-static conditions of operation for chamber validation and testing.
- In Annex D, a requirement for the EUT and equipment not to occupy more than 8 % of the total chamber volume in immunity testing has been added.
- Annex E has been extended with further guidance on the value of EUT directivity to be used in the estimation of radiated power and field.
- In Annex I, some clarifications on antenna efficiency measurements have been added.
- A new Annex K has been added that covers measurement uncertainty in reverberation chambers. -
Technical committeeTypeAcronymIEC 61000-4-20CommitteePublished year2010KeywordsDescription
IEC 61000-4-20:2010 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example, striplines and electromagnetic pulse simulators) and closed structures (for example, TEM cells). These structures can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe:
- TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations;
- TEM waveguide validation methods for EMC tests;
- the EUT (i.e. EUT cabinet and cabling) definition;
- test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and
- test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.
IEC 61000-4-20:2010 does not intend to specify the tests to be applied to any particular apparatus or system(s). The main intention of this standard is to provide a general basic reference for all interested product committees of the IEC. For radiated emissions testing, product committees should select emission limits and test methods in consultation with CISPR standards. For radiated immunity testing, product committees remain responsible for the appropriate choice of immunity tests and immunity test limits to be applied to equipment within their scope. This standard describes test methods that are separate from those of IEC 61000-4-3. This second edition cancels and replaces the first edition published in 2003 and its amendment 1 (2006), and constitutes a technical revision. It has the status of a basic EMC publication in accordance with IEC Guide 107. The main changes with respect to the first edition of this standard and its amendment are the following:
- consistency of terms (e.g. test, measurement, etc.) has been improved;
- clauses covering test considerations, evaluations and the test report have been added;
- references to large TEM waveguides have been eliminated;
- a new informative annex has been added to deal with calibration of E-field probes. -
Technical committeeTypeAcronymIEC 61000-4-2CommitteePublished year2008Description
IEC 61000-4-2:2008 relates to the immunity requirements and test methods for electrical and electronic equipment subjected to static electricity discharges, from operators directly, and from personnel to adjacent objects. It additionally defines ranges of test levels which relate to different environmental and installation conditions and establishes test procedures. The object of IEC 61000-4-2:2008 is to establish a common and reproducible basis for evaluating the performance of electrical and electronic equipment when subjected to electrostatic discharges. In addition, it includes electrostatic discharges which may occur frompersonnel to objects near vital equipment. IEC 61000-4-2:2008 defines typical waveform of the discharge current, range of test levels, test equipment, test setup, test procedure, calibration procedure and measurement uncertainty. IEC 61000-4-2:2008 gives specifications for test performed in "laboratories" and "post-installation tests" performed on equipment in the final installation. This second edition cancels and replaces the first edition published in 1995, its amendment 1 (1998) and its amendment 2 (2000) and constitutes a technical revision. It has the status of a basic EMC publication in accordance with IEC Guide 107. The main changes with respect to the first edition of this standard and its amendments are the following:
- the specifications of the target have been extended up to 4 GHz. An example of target matching these requirements is also provided;
- information on radiated fields from human-metal discharge and from ESD generators is provided;
- measurement uncertainty considerations with examples of uncertainty budgets are given too.