Photovoltaic
Photovoltaic
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Technical committeeTypeAcronymIEC TR 63279:2020CommitteePublished year2020KeywordsDescription
IEC TR 63279:2020 reviews research into sequential and combined accelerated stress tests that have been devised to determine the potential for degradation modes in PV modules that occur in the field that single-factor and steady-state tests do not show. This document is intended to provide data and theory-based motivation and help visualize the next steps for improved accelerated stress tests that will derisk PV module materials and designs. Any incremental savings as a result of increased reliability and reduced risk translates into lower levelized cost of electricity for PV. Lower costs will result in faster adoption of PV and the associated benefits of renewable energy.
Technology -
Technical committeeTypeAcronymIEC TR 63227:2020CommitteePublished year2020Description
IEC TR 63227:2020 deals with the protection of PV power supply systems against detrimental effects of lightning strikes and surge voltages of atmospheric origin. In the event that a lightning and/or surge voltage protection is required to be erected, this document describes requirements and measures for maintaining the safety, functionality, and availability of the PV power supply systems.
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Technical committeeTypeAcronymIEC TR 63226:2021CommitteePublished year2021KeywordsDescription
IEC TR 63226:2021 is intended for use as guidance for reducing fire risks in general and for site-specific needs for buildings with PV systems. In addition to the general recommendations, technical, installation, and maintenance measures can be selected to reach the intended safety level of the PV system and building, depending on the results of a risk assessment. This document contains general information about building related risks and includes measures for reducing those risks. These measures are not general requirements or recommendations. They are explained as a guide for selecting suitable measures depending on the on-site needs.
Technology -
Technical committeeTypeAcronymIEC TR 63225:2019CommitteePublished year2019KeywordsDescription
IEC TR 63225:2019 highlights the problem of incompatibility of connectors for DC-application in photovoltaic systems (DC connectors) produced by different manufacturers. It addresses four particular issues in that context: - background information on incompatibility of DC connectors from different manufacturers; - observations and challenges concerning the handling of DC connectors from different manufacturers; - stakeholders concerned by the incompatibility of DC connectors; - recommendations for long-term standardization and interim measures to address incompatibility of DC connectors.
Technology -
Technical committeeTypeAcronymIEC TR 63149:2018CommitteePublished year2018KeywordsDescription
IEC TR 63149:2018(E) is aimed at presenting mathematical models for calculation of the distance between arrays, to farthest avoid shading and reasonably reduce the land usage of PV farms. This document provides land usage calculations of PV farms for various array types.
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Technical committeeTypeAcronymIEC TR 60904-14:2020CommitteePublished year2020KeywordsDescription
IEC TR 60904-14:2020 provides guidelines for measurements of the maximum power (Pmax) output of single-junction photovoltaic (PV) modules and for reporting at standard test conditions (STC) in industrial production line settings. As it is desirable to have consistent measurement practices across the industry, this document describes the following features of such measurements: - Essential elements, in order to provide common understanding; - Common issues or complications; - Sources of error and uncertainty, including recommendations to minimize them.
Technology -
Technical committeeTypeAcronymIEC 63202-1:2019CommitteePublished year2019Description
IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance. The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.
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Technical committeeTypeAcronymIEC 63092-2:2020CommitteePublished year2020KeywordsDescription
IEC 63092-2:2020 specifies BIPV system requirements and applies to photovoltaic systems that are integrated into buildings with the photovoltaic modules used as building products. It focuses on the properties of these photovoltaic systems relevant to basic building requirements and the applicable electrotechnical requirements. This document addresses requirements on the BIPV systems in the specific ways they are intended to be mounted and the mounting structure, but not the BIPV module itself, which is within the scope of IEC 63092-1.
Technology -
Technical committeeTypeAcronymIEC 63092-1:2020CommitteePublished year2020KeywordsDescription
IEC 63092-1:2020 specifies BIPV (building-integrated photovoltaic) module requirements and applies to photovoltaic modules used as building products. It focuses on the properties of these photovoltaic modules relevant to basic building requirements and the applicable electro-technical requirements. This document addresses requirements on the BIPV modules in the specific ways they are intended to be mounted but not the mounting structure itself, which is within the scope of IEC 63092-2. This document is based on EN 50583-1.
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Technical committeeTypeAcronymIEC 62979:2017CommitteePublished year2017KeywordsDescription
IEC 62979:2017 provides a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating. This test methodology is particularly suited for testing of Schottky barrier diodes, which have the characteristic of increasing leakage current as a function of reverse bias voltage at high temperature, making them more susceptible to thermal runaway.
Technology